Software for Semiconductor Test - Instrument Control, Data Acquisition and Numerical Analysis
Metrics Technology's software products provide easy setup of supported semiconductor test systems through a point and click Windows user interface![Device Characterization](https://metricstech-wp-gae-files.storage.googleapis.com/test_and_char1.jpg)
Device Characterization
Metrics provides instrument control, data acquisition and numerical analysis for performing device charaterization and parameter extraction
![Wafer Level Reliability](https://metricstech-wp-gae-files.storage.googleapis.com/wafer_level_reliability.jpg)
Wafer Level Reliability
Based on industry standard JEDEC test methods our Metrics WLR fast wafer-level algorithms will get your reliability program up and running quickly
![Failure Analysis](https://metricstech-wp-gae-files.storage.googleapis.com/probe-station-fa1.jpg)
Failure Analysis
Analytical labs worldwide use Metrics products to perform root cause analysis of failures in semiconductor components and microelectronics