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Metrics I/CV Getting Started Guide	Drivers
Request Demo Software	System Requirements
Metrics I/CV Migration Guide	Test-of-the-Month

I/CV (I-V, C-V Characterization) Automation Software

Metrics Technology presents its latest product: automation software to perform I-V and C-V measurements and analysis for design verification, process troubleshooting,reliability engineering, and failure analysis.

The I/CV Software is a product developed by Metrics Technology that includes support for semiconductor parameter analyzers, C-V meters, low leakage switch matrixes, and semi-automatic probe stations. Metrics I/CV provides a Windows XP Professional or 2000 wizard based operator test environment, test execution and sequencing along with data logging and post-analysis.

Click on any following specifications to learn more about I/CV's capabilities.

I/CV Licensing

The I/CV software license can be purchased as a one-year Annual License or as a Perpetual License. The features of the 2 license types are summarized below:

Test Algorithms

The I/CV software comes with an assortment of sample characterization measurements for your reference. The provided parameter extractions are fully documented and editable by the end user. The user can create additional measurements and analysis routines in order to extend the capabilities of the system using the included test editor and numerical equation editor.

ICS-based Measurements and Analysis

These measurement examples come with either license type.

IV	Vg-Id (linear), Vg-Id (sat), Drain Family, Gate Family, Gate Leakage, Back Bias Family, Ids(on), Id(sat), Idss, BVdss, and Isub.
CV	Cox, Cmin, Tox, Vfb, Vth, Wmax, Nsub, Ldebye, Bulk potential, Nss, Qss, MS work function, Dit Profiling*, Band Bending Profile*

* Not available on all system configurations

VBScript-based Measurements and Analysis

These measurement examples come with only the annual license type.

NVM	8110/81110/41501B/C PGU control to perform pulsing tests of NVM materials.
WLR	HCI, NBTI, Charge-Pumping, VRAMP, JRAMP, and TDDB testing of devices.
Parametric	IV and CV testing of devices.
Test-of-the-Month	A new test or feature each month.

System Software

Metrics I/CV system software is designed to extend the capabilities of existing test and measurement development environments used to automate semiconductor characterization measurements on wafer level or packaged devices. The software provides an intuitive platform for developing, editing, and executing complex test plans on an automated lab test system.

Metrics I/CV supports several lab system configurations consisting of:

• Semiconductor parameter analyzers
• CV/LCRZ meters
• Switch matrices
• Wafer probers with thermal chucks
• Power supplies, pulse generators, etc.
  (with supported development environments)

Wizard Operator Shell

I/CV's test wizards provide step-by-step instructions to the operator when entering runtime information, selecting wafer navigation plans, selecting test plans, and starting a test.

Test wizards are conveniently organized and launched from toolbars. For example, to use the wafer test wizard, the user selects the "Semi-Auto Test" button from the "Wafer Test" toolbar. The wizard guides the user in entering all necessary parameters, instructs the operator to verify the alignment of the wafer, and then displays a runtime control and status window. The operator then clicks the "start" button to execute the selected test plan across the wafer.

Graphical Algorithm Generation

Tests can be generated and edited using the Metrics ICS graphical workspace which allows rapid test development with no programming required.

Tests can also be generated in the integrated VBScript environment. Metrics Technology provides a library of functions for the control of IV instruments. In addition, access to sending instrument-specific commands strings is supported with the GPIB management provided in I/CV. You are allowed the specific level of control you need.

Scripting Tools

The I/CV scripting tools provide access to a library of built-in software components supporting all the functions necessary to create a variety of test plans. The script editor provides a "wizard-based" interface for building a test script so the user does not have to learn any complicated command syntax or spend time debugging mistyped commands. The following components are included:

• Automated sub-die prober movement
• Executing a switch connection
• Executing a test algorithm
• Pass/Fail determination and processing using VBScript
• Conditional branching IF, ELSE using VBScript
• Looping FOR, WHILE using VBScript
• Creating user variables using VBScript
• Prompting the user using VBScript
• Displaying messages using VBScript
• Commenting test scripts

Auto-Analysis and Reporting

I/CV has data analysis tools included for extracting parametric quantities from the test data and generating several standard reports and graphs including:

• Color wafer maps
• Histograms
• Parameter statistics
• Parametric values vs. die location
• Tables of I-V or C-V curve data

These tools can be used to create reports and wafer maps at run-time as well as post-test. The tools can also be installed on a second PC to allow the analysis of data without interfering with the data collection.