- Products
- Metrics I/CV
- Metrics ICS
- Metrics Win4145
- Agilent I/CV
- Sales
- Quotes
- Order Form
- Resellers
- Demo Software
- Support
- Register
- Technical Support
- Software Fixes
- FAQ's
- Applications
- Application Notes
- Company
- Contact us
- Privacy
- Home Page
 Metrics ICS Getting Started Guide |
Drivers |
| Request Demo Software |
System Requirements |
| Metrics ICS Migration Guide |
ICS Interactive Characterization Software
ICS controls specialized semiconductor test and measurement instrumentation and provides easy setup for complex instrumentation through an interactive Microsoft Windows graphical user interface and requires no programming by the end user.
It has a full suite of data analysis tools and provides quick transfer of data to popular software packages such as spreadsheets, word processors and databases. This popular software product is a productive application for performing interactive characterization measurements on semiconductor devices.
ICS Point, Click, and Measure Capabilities
ICS Graphic and Data Analysis
ICS Comprehensive Data management
| ICS Applications |
Device Characterization
Automatically characterize new devices using auto-sequence execution of measurements. Data is stored based on user-defined attributes such as process, lot, wafer, die and more.
Process Monitoring
Solve in-line production problems by tracking parameters such as line width, resistivity, and mask alignment. Automatically export results to generate early warning reports.
Failure Analysis
Debug VLSI subcircuits by using ICS's suite of measurement modes and powerful analysis functions to efficiently assess failures. SMUs in standby mode remain programmed as other SMUs are reset for the next measurement, eliminating the need for external power supplies.
Incoming Inspection
Automate your inspection of large quantities of devices by dynamically linking measured or extracted data, and performing comparisons to upper and lower control limits.
| Process Development
Automate parameter extraction such as Threshold Voltage using the Numerical Transform Editor. The Transform Editor defines nested equations used to extract parameters from measured data. |
 to view larger graph |
| Parametric Extraction with ICS | |
to view larger graph |
|
| Graphical Test Generation | ||
| Use the Setup Editor to configure measurement routines without writing a single line of code. Instrument and test fixture connections are created by matching instrument icons to the terminals of a workspace schematic Device Under Test (DUT). A single click at each module or channel icon opens a Setup dialog unique to each source of the instrument. |
|
|
