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Metrics I/CV FAQ's

Run-Time

List of Questions

1. I would like to see the current data curve, but ICS is minimized. How do I view the data curve while the system is running?
Answer

2. I would like to see a wafer map created while the test is running. How do I accomplish this?
Answer

3. I would like to see a table of extracted parameters created while the test is running. How do I accomplish this?
Answer

Answers to Questions

1. I would like to see the current data curve, but ICS is minimized. How do I view the data curve while the system is running?

Beginning in version 2.0 a reporting feature has been added in the Module Editor. This feature allows the user to specify data that they would like to see plotted during the course of the wafer test. To access this feature click the Reports button in the Module Editor.

2. I would like to see a wafer map created while the test is running. How do I accomplish this?

Beginning in version 2.0 a reporting feature has been added in the Module Editor. This feature allows the user to specify a parameter that they would like to see mapped during the course of the wafer test. To access this feature click the Reports button in the Module Editor.

3. I would like to see a table of extracted parameters created while the test is running. How do I accomplish this?

Beginning in version 2.0 a reporting feature has been added in the Module Editor. This feature allows the user to specify data parameters that they would like to see reported during the course of the wafer test. To access this feature click the Reports button in the Module Editor.