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ICS controls specialized semiconductor test and measurement instrumentation and provides easy setup for complex instrumentation through a interactive Microsoft Windows graphical user interface and requires no programming by the end user.
It has a full suite of data analysis tools and provides quick transfer of data to popular software packages such as spreadsheets, word processors and databases. This popular software product is a productive application for performing interactive characterization measurements on semiconductor devices.
Please click on the topic of inquiry below for more information.
GPIB InterfacesInstallation
Data AcquisitionFile I/O
Plots and AnalysisNetworking
Platforms & OSPrinting
DDE ProgrammingInstrument Drivers